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| Part Number: | CY62128ELL-55SXE |
|---|---|
| Manufacturer/Brand: | Cypress Semiconductor (Infineon Technologies) |
| Part of Description: | IC SRAM 1MBIT PARALLEL 32SOIC |
| Datasheets: |
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| RoHs Status: | ROHS3 Compliant |
| Payment: | PayPal / Credit Card / T/T |
| Shipment Way: | DHL / Fedex / TNT / UPS / EMS |
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Ship From: Hong Kong
| Quantity | Unit Price |
|---|---|
| 1+ | $2.5626 |
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| Product Attribute | Attribute Value |
|---|---|
| Write Cycle Time - Word, Page | 55ns |
| Voltage - Supply | 4.5V ~ 5.5V |
| Technology | SRAM - Asynchronous |
| Supplier Device Package | 32-SOIC |
| Series | MoBL® |
| Package / Case | 32-SOIC (0.445", 11.30mm Width) |
| Package | Tube |
| Operating Temperature | -40°C ~ 125°C (TA) |
| Product Attribute | Attribute Value |
|---|---|
| Mounting Type | Surface Mount |
| Memory Type | Volatile |
| Memory Size | 1Mbit |
| Memory Organization | 128K x 8 |
| Memory Interface | Parallel |
| Memory Format | SRAM |
| Base Product Number | CY62128 |
| Access Time | 55 ns |




The CY62128ELL-55SXE, developed by Infineon Technologies (including Cypress legacy), is a 1-Mbit (128 K × 8-bit) asynchronous static RAM (SRAM) designed for ultra-low power operation and high-speed access. Housed in a standard 32-pin SOIC package, this device provides robust performance and a broad operating voltage range, making it well-suited for both industrial and demanding automotive environments. Its design is rooted in maximizing battery life for portable and embedded applications, embodied by Infineon’s MoBL® (More Battery Life) SRAM family. With a 55 ns random access time and comprehensive support for extended temperature ranges, the CY62128ELL-55SXE targets applications requiring reliable non-volatile memory with low system power overhead.
The CY62128ELL-55SXE stands out for its combination of speed, reliability, and power efficiency. Key features include:
High-Speed Operation: 45 ns and 55 ns speed grades are available to match system timing requirements.
Ultra-Low Power Consumption: Typical standby current is only 1 µA, with a maximum of 4 µA in industrial settings—crucial for battery-powered designs. Active current draws as low as 1.3 mA at 1 MHz.
Broad Temperature Support: Qualified for industrial (-40°C to +85°C) and automotive (-40°C to +125°C) environments to ensure robustness across various deployment scenarios.
Flexible Voltage Range: Operates reliably from 4.5 V to 5.5 V, aligning with common embedded platforms.
Compatibility: Pin-compatible with previous generation CY62128B devices, simplifying upgrades and second-sourcing for ongoing production.
Automatic Power-Down: Dramatically reduces power usage when not accessed, integrating seamlessly with power-sensitive designs.
CMOS Process: Leverages CMOS technology to optimize speed and minimize dissipation.
Multiple Package Options: 32-pin STSOP, SOIC, and TSOP I packages support diverse board layouts and manufacturing preferences.
These attributes collectively make the CY62128ELL-55SXE an ideal fit for embedded systems requiring both performance and energy efficiency.
At its core, the CY62128ELL-55SXE is a high-performance static RAM organized as 128 K × 8 bits. It features a fully asynchronous interface using separate inputs for address, data, and control signals. Major aspects of its functional operation include:
Read Access: Place Chip Enable (CE1 low and CE2 high) and Output Enable (OE low) while Write Enable (WE) is high. The addressed data is driven onto the I/O pins (I/O0–I/O7).
Write Operation: Set CE1 low, CE2 high, and WE low. Data presented on the I/O pins is written to the specified address.
Standby Mode: When not selected (CE1 high or CE2 low), the device enters a standby state with minimal power draw and tri-states its I/O lines.
Data Protection: All input and output lines are automatically set to high impedance during writes or device deselection, providing robust system-level protection.
Power Down: The automatic power-down circuitry ensures consumption is <1% of active usage when the memory is idle.
Notably, the I/O levels are compatible with processors supporting TTL input thresholds rather than full CMOS levels, a consideration for interfacing with certain legacy processors.
The CY62128ELL-55SXE is engineered for harsh environments and tight power budgets. Core specifications include:
Supply Voltage: 4.5 V – 5.5 V.
Speed: 55 ns maximum (45 ns available in other speed grades).
Maximum Drive Capability: Output current into outputs (Low) = 20 mA.
Static Standby Current: Typical 1 μA, max 4 μA (Industrial).
Active Current: Typical 1.3 mA at 1 MHz.
ESD Protection: >2001 V (MIL-STD-883, Method 3015).
Latch-Up Immunity: >200 mA.
Storage Temperature: -65°C to +150°C; operational temp up to +125°C (automotive).
Detailed DC and AC performance parameters, including switching waveforms and data retention characteristics, ensure reliable integration in systems with stringent timing, power, and environmental constraints.
The CY62128ELL-55SXE is optimized for ease of expansion and flexible system-level integration:
Multiple chip enables (CE1, CE2) and Output Enable (OE) pins facilitate seamless memory expansion for larger capacity arrays or multi-bank configurations.
The device supports automatic power-down and standby, making it suitable for always-on applications with frequent memory access cycles.
It is easily interfaced with microcontrollers, microprocessors, and ASICs using parallel data and address buses.
Application designers should note the I/O level compatibility and may refer to technical documentation for guidance when interfacing with processors requiring CMOS thresholds.
Supporting standard board design, the SRAM is a reliable drop-in replacement for similar devices, ensuring longevity and ease of maintenance in the field.
For design flexibility and streamlined manufacturing, the CY62128ELL-55SXE is offered in several standard packages:
32-pin SOIC (Small Outline IC): Suited for standard through-hole and surface-mount PCB assembly.
32-pin STSOP (Shrink Thin Small Outline Package): Optimized for high-density layout and space-constrained systems.
32-pin TSOP I (Thin Small Outline Package): Preferred for low-profile, densely packed PCBs, particularly in portable or automotive designs.
The standard pinout and configuration are fully documented, with unused pins (NC) left unconnected, ensuring straightforward mounting and routing on multilayer boards.
The CY62128ELL-55SXE satisfies key needs in applications where non-volatile, high-reliability SRAM is essential. Typical scenarios include:
Battery-powered portable devices (data loggers, handheld instruments) leveraging MoBL® technology for extended power autonomy.
Automotive ECUs and industrial controllers, benefiting from the device’s qualified temperature range and robust electrical immunity.
Embedded systems in harsh environments, using power-down and standby features to balance active performance and energy savings.
Engineering considerations when implementing the CY62128ELL-55SXE include matching I/O voltage thresholds with host logic, ensuring proper timing in parallel bus designs, and selecting the optimal package for system requirements.
For engineers anticipating second-sourcing or seeking alternate suppliers, the CY62128ELL-55SXE is pin-compatible with the Cypress/Infineon CY62128B series. It is critical to verify that electrical characteristics—especially speed, standby current, and I/O compatibility—match system requirements when considering alternatives. In cases where full CMOS-level compatibility is needed, Infineon Technologies and other manufacturers may offer application notes or alternative part recommendations. Assessing package availability is also prudent when qualifying a replacement part.
The CY62128ELL-55SXE from Infineon Technologies delivers a combination of ultra-low power, fast parallel SRAM access, and broad environmental robustness. Its legacy and design flexibility make it a proven solution for embedded and portable applications where data integrity, low power, and high speed are paramount. The various package options, strong electrical specifications, and compatibility with previous SRAM generations facilitate seamless integration, while the proven reliability and low system power consumption align well with modern engineering requirements. This versatile SRAM remains a competitive and dependable option for engineers ensuring memory subsystem reliability across diverse embedded applications.
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