Texas Instruments SN74ACT8997DW

Mfr. Part

SN74ACT8997DW

Manufacturer

Luminary Micro Texas Instruments

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Detailed Description

SN74ACT8997DW is a 4-bit scan-path linker in the 74ACT high-speed logic family. It is designed to connect, segment, or bypass scan chains for board and system test. Running from a 5 V supply, it offers TTL-compatible inputs and fast CMOS outputs. The device helps engineers manage boundary-scan and internal scan chains by linking multiple scan segments, improving test access, shortening test time, and simplifying debug on complex digital systems. It comes in a 28‑pin SOIC package for surface-mount assembly and supports commercial temperature operation.

Key Features

Logic function scan-path linker for test and debug

4-bit width for compact scan-chain control

74ACT family high-speed CMOS with TTL-compatible inputs

Operates from 4.5 V to 5.5 V nominal 5 V

Commercial temperature range 0 to 70 C

Surface mount 28-SOIC package 7.50 mm body width

RoHS3 compliant and Pb-free

Base product number 74ACT8997

Series 74ACT

Key Advantages

Simplifies board and system test by easily linking or bypassing scan segments

Speeds test execution by reconfiguring scan paths as needed

Reduces need for manual jumpers or custom test wiring

High-speed ACT family ensures minimal delay impact on scan timing

TTL-compatible inputs ease interfacing with legacy 5 V systems

Standard SOIC footprint supports straightforward assembly and rework

Packaging

Shipment format Tube

Package type 28-SOIC standard body width 0.295 inch 7.50 mm

Mounting type Surface mount SMD

Lead pitch typical 1.27 mm

Pin count 28 see device datasheet for full pinout and signal mapping

Materials Molded epoxy body Pb-free tin or NiPdAu plated copper alloy leads RoHS3 compliant

Supplier device package 28-SOIC

Thermal characteristics Dependent on PCB copper area and airflow refer to datasheet for thermal data and recommended derating

Electrical properties family level Operates from 4.5 V to 5.5 V TTL-compatible inputs CMOS outputs propagation delays and drive strength per 74ACT family see datasheet for limits

Lifecycle

Status Generally supplied and supported in the 74ACT family at time of writing availability can vary by region and date

Not flagged as nearing discontinuation in public sources Always verify current status

Direct drop-in equivalents are limited because scan-path linkers are specialized

If you need alternatives or cross-references contact Y-IC sales via our website We can help identify compatible devices within TI families or functionally similar parts from other vendors after checking pinout timing and control logic

Key Application Areas

Boundary-scan JTAG chain management and board test

Production test and in-circuit test DFT scan-chain configuration

System bring-up and debug with selective scan insertion removal

Complex digital assemblies networking telecom servers storage

Industrial control and instrumentation with extensive scan architectures

Backplane or multi-board systems that require reconfigurable scan paths

Datasheet

Y-IC hosts the most authoritative datasheet for SN74ACT8997DW on our product page Download it now to get full pin descriptions timing diagrams electrical limits and layout guidance

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