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| Part Number: | SPC5604BACLL6 |
|---|---|
| Manufacturer/Brand: | NXP USA Inc. |
| Part of Description: | IC MCU 32BIT 512KB FLASH 100LQFP |
| Datasheets: |
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| RoHs Status: | ROHS3 Compliant |
| Payment: | PayPal / Credit Card / T/T |
| Shipment Way: | DHL / Fedex / TNT / UPS / EMS |
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Ship From: Hong Kong
| Quantity | Unit Price |
|---|---|
| 1+ | $16.1772 |
| 200+ | $6.2606 |
| 500+ | $6.0412 |
| 1000+ | $5.9314 |
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| Product Attribute | Attribute Value |
|---|---|
| Voltage - Supply (Vcc/Vdd) | 3V ~ 5.5V |
| Supplier Device Package | 100-LQFP (14x14) |
| Speed | 64MHz |
| Series | MPC56xx Qorivva |
| RAM Size | 32K x 8 |
| Program Memory Type | FLASH |
| Program Memory Size | 512KB (512K x 8) |
| Peripherals | DMA, POR, PWM, WDT |
| Package / Case | 100-LQFP |
| Package | Tray |
| Product Attribute | Attribute Value |
|---|---|
| Oscillator Type | Internal |
| Operating Temperature | -40°C ~ 85°C (TA) |
| Number of I/O | 79 |
| Mounting Type | Surface Mount |
| EEPROM Size | 64K x 8 |
| Data Converters | A/D 28x10b |
| Core Size | 32-Bit Single-Core |
| Core Processor | e200z0h |
| Connectivity | CANbus, I²C, LINbus, SCI, SPI |
| Base Product Number | SPC5604 |




The SPC5604BACLL6 is a member of NXP's MPC5604B/C series, a next-generation automotive-grade microcontroller developed for embedded body electronics applications. Housed in a 100-pin LQFP package (14x14 mm), it features a 32-bit e200z0h single-core CPU operating at up to 64MHz, paired with 512KB of on-chip flash memory and optimized for high reliability, low power consumption, and flexible peripheral integration. The MPC5604B/C family is built to address advanced automotive control requirements by leveraging the Power Architecture® embedded specification, making it suitable for demanding electronic module tasks within modern vehicles and other complex control environments.
At the heart of SPC5604BACLL6 lies NXP's e200z0h core, compliant with the Power Architecture® embedded category. This 32-bit core operates at frequencies up to 64MHz and supports Variable Length Encoding (VLE), a feature that allows mixed 16- and 32-bit instruction sets to optimize code density—critical for embedded designs where code footprint and memory utilization are primary concerns. The core architecture brings advanced processing performance with support for fast interrupt handling (via a controller supporting up to 148 interrupt vectors), comprehensive memory protection (MPU with eight regions and 32-byte granularity), and tools for secure execution and software development, including a Nexus IEEE-ISTO 5001-2003 Class Two Plus compliant interface for real-time system analysis.
SPC5604BACLL6 integrates several key memory and data security technologies:
512KB code flash memory with Error Correction Code (ECC) support, ensuring high reliability for program storage and execution.
64KB data flash (4x16KB) also protected by ECC, suitable for non-volatile data and calibration storage.
Up to 48KB SRAM with ECC, designed for robust data retention and protection against single-bit faults.
The memory subsystem is managed by a dedicated flash controller and boot assist module (BAM), supporting internal flash programming via CAN or SCI serial links and minimizing risk during in-field re-flashing or maintenance.
The rich peripheral set of SPC5604BACLL6 enables extensive connectivity and system integration, including:
Up to 6 FlexCAN modules for automotive-grade CAN networking (actual count depends on package and configuration).
Three DSPI (serial peripheral interface) modules for high-speed device communication.
Up to 4 LINFlex modules providing flexible LIN or UART functionality for automotive and industrial interconnections.
One I2C module for standard two-wire serial communications.
10-bit SAR ADC supporting precise analog measurement capabilities.
eMIOS-lite timer subsystem offering 16-bit input capture, output compare, and pulse-width modulation (PWM) channels—essential for motor and actuator control.
Real-Time Counter (RTC) with autonomous wakeup capabilities for power-sensitive designs.
Up to 123 general-purpose configurable I/O pins, enabling diverse hardware interfacing options.
Up to 6 Periodic Interrupt Timers (PITs) and a System Module Timer (STM) for high-resolution time-base management.
Peripheral selection and multiplexing are managed via SIUL module register settings, allowing design engineers to customize pin function assignments and optimize board layouts.
The SPC5604BACLL6 is delivered in a 100-LQFP package, offering a balanced footprint for both automotive and industrial platforms. The pinout enables concurrent access to key interfaces and memory while supporting alternate functions on many pins for design flexibility. During system reset and power-up phases, pad configurations are managed to protect device integrity and guide correct boot behavior. System designers should note that all functional pins are available as general-purpose I/O by default, except those dedicated to JTAG and Nexus debug operations. Robust guidance is provided for external pull-up/pull-down resistor selection and capacitance requirements for voltage stabilization across supply domains.
SPC5604BACLL6 supports both 3.3V and 5.0V supply ranges, with detailed requirements for decoupling capacitor values and distribution to maintain stable operation. The internal voltage regulator generates multiple low-voltage domains for core, flash, and digital logic, with external stabilization capacitors required for reliable performance. Power-on Reset (POR) and Low Voltage Detector (LVD) modules ensure safe power-up and voltage monitoring: failure to meet specified minimum voltage triggers automatic resets, protecting system integrity. Maximum and recommended ratings are specified for all I/O types, with consideration for transition speeds, input leakage currents, output drive, and EMC optimization. Power consumption figures are provided for key modes such as run, stop, and standby, allowing engineers to estimate thermal load and battery impact in real-world scenarios.
Thermal management for SPC5604BACLL6 is essential, especially given its -40°C to +125°C ambient operating temperature range. The device package features defined thermal resistances (junction-to-ambient, junction-to-board, and junction-to-case), rated in line with JEDEC and MIL-STD specifications. The calculation of chip junction temperature and related power dissipation must be considered in system design. High reliability is promoted via ECC protection throughout memory, robust design margins in electrical sensitivity against ESD and latch-up events, and detailed recommendations for external component selection (including voltage regulator circuitry for minimum ESR and capacitance). Engineers should ensure that RAM data retention is preserved at all times by keeping core supply voltage above the minimum 1.08V.
A key feature of SPC5604BACLL6 is its 10-bit SAR ADC subsystem, designed for high-precision measurements in control systems. Proper operation requires attention to input impedance; analog source circuitry should be configured with low AC impedance and should utilize input capacitors with appropriate high-frequency characteristics to filter noise and provide charge during sampling phases. RC input filter design must consider ADC conversion rates and external source bandwidth to avoid signal distortion or measurement errors, with recommendations provided for ideal resistance and capacitance values. Sampling and conversion timing parameters enable reliable data acquisition, with support for continuous conversion cycles. System integrators should utilize ECC-protected memory and calculation tools for error compensation and calibration, particularly in critical real-time measurement applications.
SPC5604BACLL6 supports hardened EMC/EMI design, with guidelines for software and hardware optimization. The device features slew rate control on I/O pads, configurable for slow, medium, or fast transitions to balance EMC constraints with performance needs. It meets IEC 61967-1 standards for radiated emission, and comes with recommendations for software routines to manage unexpected resets and program counter corruption, supporting robust performance in noisy environments. ESD and latch-up protection are integrated, with performance verified via industry-standard stress testing. Designers are advised to prequalify software routines and test circuits for resilience under EMC and ESD conditions, taking advantage of advice for filtering, shielding, and system integration.
For engineers evaluating alternatives or planning future-proof replacement solutions, the following NXP MPC5604B/C series models and packages may serve as equivalents depending on functional, I/O, or package requirements:
MPC5604B devices in different LQFP or MAPBGA packages, suited for applications requiring varying pin-counts or development-specific features (notably Nexus 2+ debug).
MPC5604C variants, featuring enhanced options in I/O or peripheral multiplexing.
MPC5607B models for higher memory and extended I/O requirements, with attention to pin compatibility and supply domain allocation.
Selection among these should be based on detailed comparison of pin-count, available peripheral modules, package form factors, and potential impact on hardware and firmware compatibility.
: Key Evaluation Points for SPC5604BACLL6 Selection
The SPC5604BACLL6 from NXP offers a balanced combination of performance, reliability, and integration for automotive and industrial control applications. It delivers the advantages of Power Architecture® processing, fine-grained memory protection, robust peripheral connectivity, and dedicated EMC/EMI optimization. Key selection criteria for system engineers and procurement teams include validation of power supply arrangements, compatibility of package and pinout for the intended application, robustness against environmental stress, and properly architected peripheral interfaces. When evaluating SPC5604BACLL6 for new designs or as a replacement model, detailed attention to memory, voltage, and thermal requirements will ensure optimal implementation and long-term reliability in mission-critical embedded systems.
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